Acknowledgements for the Handbook

• Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
  
• Paul Tobias- Statistical Methods Group, SEMATECH

1. Exploratory Data Analysis:
   • James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
2. Measurement Process Characterization:
   • Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
3. Production Process Characterization:
   • Barry Hembree - AMD
4. Process Modeling:
   • William Guthrie - Statistical Engineering Division, Information Technology Laboratory, NIST
5. Process Improvement:
   • Paul Tobias - Statistical Methods Group, SEMATECH
   • Ledi Trutna- Advanced Micro Devices
6. Process or Product Monitoring and Control:
   • Jack Prins - Statistical Methods Group, SEMATECH
7. Product and Process Comparisons:
   • Jack Prins - Statistical Methods Group, SEMATECH
8. Assessing Product Reliability:
   • Paul Tobias - Statistical Methods Group, SEMATECH

• Chelli Zey - Statistical Methods Group, SEMATECH

1. Exploratory Data Analysis:
   • James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
   • Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
2. Measurement Process Characterization:
   • Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
3. Production Process Characterization:
   • Barry Hembree - AMD
4. Process Modeling:
   • William Guthrie- Statistical Engineering Division, Information Technology Laboratory, NIST
5. Process Improvement:
   • Ledi Trutna- Advanced Micro Devices
   • Pat Spagon- Motorola University
   • Dr. Enrique del Castillo - Associate Professor, Department of Industrial & Manufacturing Engineering, Pennsylvania State University
   • Terri Moore - Motorola
   • Sam Hartley - Motorola
   • Arnon Hurwitz - QualTech Motorola
6. Process or Product Monitoring and Control:
   • Jack Prins - Statistical Methods Group, SEMATECH
7. Product and Process Comparisons:
   • Jack Prins - Statistical Methods Group, SEMATECH
   • Don McCormack - Statistical Methods Group, SEMATECH
   • Di Michelson - Statistical Methods Group, SEMATECH
   • Karen Horrell - Statistical Methods Group, SEMATECH
8. Assessing Product Reliability:
   • Paul Tobias - Statistical Methods Group, SEMATECH

• Keith Eberhardt - Nabisco
• Dom Vecchia - Statistical Engineering Division, Information Technology Laboratory, NIST
• Nien-Fan Zhang - Statistical Engineering Division, Information Technology Laboratory, NIST
• Jack Wang - Statistical Engineering Division, Information Technology Laboratory, NIST
• David Banks - Department of Transportation
• Mark Levenson - Statistical Engineering Division, Information Technology Laboratory, NIST

• Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
• Cesar Iriarte- Iris Visual Design
• George Kaupus- AMD
• Mark Reeder
• Chelli Zey - Statistical Methods Group, SEMATECH

• Cesar Iriarte - Iris Visual Design

• James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
• Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
• Robert Lipman - Building and Fire Research Laboratory, NIST

• James Ehrstein -NIST: Check standard for resistivity measurements
• James Ehrstein -NIST: Gauge study of resistivity probes
• Paul Pontius -NIST: Load cell calibration